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Investigation of interface roughness and roughness correlation in solid-state multilayer by coplanar diffuse X-ray scattering

✍ Scribed by Ingo Busch; Jürgen Stümpel


Book ID
111715619
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
120 KB
Volume
212-213
Category
Article
ISSN
0169-4332

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