Depth profiles have been made for a new batch of the certified reference material, BCR 261, of ~30 nm and 100 nm of anodic tantalum pentoxide layers on tantalum foil. Atomic force microscopy studies show that the preparation method traditionally used provides an excellent substrate root-mean-square
✦ LIBER ✦
Characterization of interfaces of alumina – high alloyed steels by SST and AES depth profiling
✍ Scribed by A. H. J. van den Berg; M. A. Smithers; V. A. C. Haanappel
- Publisher
- Springer
- Year
- 1997
- Tongue
- English
- Weight
- 97 KB
- Volume
- 358
- Category
- Article
- ISSN
- 1618-2650
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
Depth resolution in sputter depth profil
✍
Seah, M. P.; Spencer, S. J.; Gilmore, I. S.; Johnstone, J. E.
📂
Article
📅
2000
🏛
John Wiley and Sons
🌐
English
⚖ 318 KB
👁 2 views
Characterization of titanium hydride fil
✍
Lisowski, W.; van den Berg, A. H. J.; Leonard, D.; Mathieu, H. J.
📂
Article
📅
2000
🏛
John Wiley and Sons
🌐
English
⚖ 98 KB
👁 2 views
Thin titanium hydride (TiH y ) films, covered by ultrathin gold layers, have been compared with the corresponding titanium films after analysis using a combination of time-of-flight SIMS (ToF-SIMS), XPS and AES. The TiH y layers were prepared under UHV conditions by precisely controlled hydrogen sor
Cupferron separation for the determinati
✍
Yûetsu Danzaki; Kunio Takada; Kazuaki Wagatsuma
📂
Article
📅
1998
🏛
Springer
🌐
English
⚖ 63 KB
Characterization of ion-beam- and magnet
✍
C. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner
📂
Article
📅
1989
🏛
Elsevier Science
🌐
English
⚖ 410 KB
Fracture dynamics of hydrogen assisted c
📂
Article
📅
1995
🏛
Elsevier Science
🌐
English
⚖ 121 KB