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Characterization of InGaN/GaN epitaxial layers by aberration corrected TEM/STEM

โœ Scribed by Houari Amari; Ian M. Ross; Tao Wang; Thomas Walther

Book ID
112182340
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
846 KB
Volume
9
Category
Article
ISSN
1862-6351

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