Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy

✍ Scribed by Im, H.-J.; Ding, Y.; Pelz, J.; Heying, B.; Speck, J.

• Book ID: 115513536
• Publisher: The American Physical Society
• Year: 2001
• Tongue: English
• Weight: 625 KB
• Volume: 87
• Category: Article
• ISSN: 0031-9007
• DOI: 10.1103/physrevlett.87.106802