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Characterization of threading dislocations in GaN using low-temperature aqueous KOH etching and atomic force microscopy

✍ Scribed by I. Han; R. Datta; S. Mahajan; R. Bertram; E. Lindow; C. Werkhoven; C. Arena

Book ID: 113897521
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 377 KB
Volume: 59
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2008.07.046

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