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Characterization of indium–tin oxide films by means of ion-implanted nuclear probes

✍ Scribed by H Metzner; S Habenicht; Th Hahn; M Uhrmacher; K.-P Lieb; D Borchert; R Job; W.R Fahrner

Book ID: 108389247
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 173 KB
Volume: 317
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(97)00613-5

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