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Characterization of High Energy Electron Irradiation Damage in UPt3Samples

✍ Scribed by P. Rodière; J. P. Brison; A. D. Huxley; F. Rullier Albenque; J. Flouquet

Book ID
110440359
Publisher
Springer US
Year
2003
Tongue
English
Weight
498 KB
Volume
132
Category
Article
ISSN
0022-2291

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## Abstract The quantitative characterization of complex microdefect structures in silicon crystals grown by Czochralski method and irradiated with various doses of high‐energy electrons (18 MeV) has been performed by methods of the high‐resolution X‐ray diffraction. The concentrations and average