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Characterization of Ge nanocrystals embedded in SiO 2 by Raman spectroscopy

✍ Scribed by Serincan, U; Kartopu, G; Guennes, A; Finstad, T G; Turan, R; Ekinci, Y; Bayliss, S C

Book ID: 120375404
Publisher: Institute of Physics
Year: 2003
Tongue: English
Weight: 155 KB
Volume: 19
Category: Article
ISSN: 0268-1242
DOI: 10.1088/0268-1242/19/2/021

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