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Characterization of films and interfaces in n-ZnO/p-Si photodiodes

✍ Scribed by J.Y. Lee; Y.S. Choi; W.H. Choi; H.W. Yeom; Y.K. Yoon; J.H. Kim; S. Im

Book ID: 114085475
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 187 KB
Volume: 420-421
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(02)00742-3

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