𝔖 Bobbio Scriptorium

✦ LIBER ✦

Characterization of film defects in silicon epitaxial wafers : C. A. Lenie. SCP and Solid State Technol., August, 41 (1964)

Book ID: 113190044
Publisher: Elsevier Science
Year: 1965
Tongue: English
Weight: 94 KB
Volume: 4
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(65)90050-8

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📜 SIMILAR VOLUMES

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Measurement of layer thickness of silicon epitaxial wafers : R. J. Walsh. SCP and Solid State Technol., August, 23 (1964)

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Determination of impurity distribution p

Determination of impurity distribution profiles in silicon epitaxial wafers : F. S. Kovacs and A. S. Epstein. SCP and Solid State Technol., August, 32 (1964)

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Measurement of the resistivity of silico

Measurement of the resistivity of silicon epitaxial wafers : P. J. H. Dobbs and F. S. Kovacs. SCP and Solid State Technol., August, 28 (1964)

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