Measurement of the resistivity of silicon epitaxial wafers : P. J. H. Dobbs and F. S. Kovacs. SCP and Solid State Technol., August, 28 (1964)

• Book ID: 113190042
• Publisher: Elsevier Science
• Year: 1965
• Tongue: English
• Weight: 94 KB
• Volume: 4
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(65)90048-x