✦ LIBER ✦

Characterization of electron trapping defects on silicon by scanning tunneling microscopy

✍ Scribed by R.H. Koch; R.J. Hamers

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of electron trapping de

✍ R.H. Koch; R.J. Hamers 📂 Article 📅 1987 🏛 Elsevier Science ⚖ 58 KB

Local characterization of ultrathin oxid

✍ A.L. Vasquez de Parga; C. Ocal; J.E. Ortega; R. Miranda 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 423 KB

Characterized by Scanning Tunneling Micr

✍ Suzuki, Shushi; Fukui, Ken-ichi; Onishi, Hiroshi; Iwasawa, Yasuhiro 📂 Article 📅 2000 🏛 The American Physical Society 🌐 English ⚖ 666 KB

Dysprosium disilicide nanostructures on

✍ Gangfeng Ye; Jun Nogami; Martin A. Crimp 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 493 KB

Characterization of surface defects in B

✍ Magonov, S.N.; Bar, G.; Cantow, H.-J.; Laukhin, V.N.; Yagubskii, E.B. 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 971 KB

Scanning tunneling microscopy of N2H4 on

✍ C. Tindall; L. Li; O. Takaoka; Y. Hasegawa; T. Sakurai 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 572 KB