๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterization of electron trapping defects on silicon by scanning tunneling microscopy

โœ Scribed by R.H. Koch; R.J. Hamers

Publisher
Elsevier Science
Year
1987
Weight
58 KB
Volume
181
Category
Article
ISSN
0167-2584

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Trap creation in ultrathin SiO2 films du
Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy
โœ Kenji Ohmori; Shigeaki Zaima; Yukio Yasuda ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 396 KB

## ลฝ . ลฝ . Scanning tunneling microscopy STM and scanning tunneling spectroscopy STS have been employed for the investigation of trap creation in ultrathin SiO films on an atomic scale. Bright spots created by electron injection using 2 STM tips were observed in STM images. The density of bright s