Characterization of dislocation etch pits in HVPE-grown GaN using different wet chemical etching methods

✍ Scribed by Lei zhang; Yongliang Shao; Yongzhong Wu; Xiaopeng Hao; Xiufang Chen; Shuang Qu; Xiangang Xu

• Book ID: 116606898
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 545 KB
• Volume: 504
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2010.05.085