Observation of dislocation etch pits in a sapphire crystal grown by Cz method using environmental SEM

✍ Scribed by Jingzhong Xiao; Shaotang Yin; Manjun Shao; Xiyi Zhang

• Book ID: 108165780
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 224 KB
• Volume: 266
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2004.03.021