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Observation of dislocation etch pits in a sapphire crystal grown by Cz method using environmental SEM

โœ Scribed by Jingzhong Xiao; Shaotang Yin; Manjun Shao; Xiyi Zhang


Book ID
108165780
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
224 KB
Volume
266
Category
Article
ISSN
0022-0248

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