Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor

✍ Scribed by Won-Ho Choi; Jungwoo Oh; Ook-Sang Yoo; In-Shik Han; Min-Ki Na; Hyuk-Min Kwon; Byung-Suk Park; P. Majhi; H.-H. Tseng; R. Jammy; Hi-Deok Lee

• Book ID: 113797722
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 582 KB
• Volume: 88
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2009.11.019