Characterization of density-of-states in indium zinc oxide thin-film transistor from temperature stress studies

✍ Scribed by Ding, Xingwei; Zhang, Jianhua; Shi, Weimin; Zhang, Hao; Huang, Chuanxin; Li, Jun; Jiang, Xueyin; Zhang, Zhilin

• Book ID: 125802026
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 936 KB
• Volume: 27
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2014.06.046