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Characterization of Defect Levels in Doped and Undoped CuGaSe2 by Means of Photoluminescence Measurements

✍ Scribed by Schön, J. H. ;Schenker, O. ;Riazi-Nejad, H. ;Friemelt, K. ;Kloc, Ch. ;Bucher, E.

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 314 KB
Volume: 161
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(199705)161:1<301::aid-pssa301>3.0.co;2-q

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