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Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescence

✍ Scribed by Umezawa, Hitoshi; Kato, Yukako; Watanabe, Hideyuki; Omer, Ashraf M.M.; Yamaguchi, Hirotaka; Shikata, Shin-ichi

Book ID: 123208357
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 997 KB
Volume: 20
Category: Article
ISSN: 0925-9635
DOI: 10.1016/j.diamond.2011.02.007

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