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Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

✍ Scribed by W. Wierzchowski; K. Wieteska; W. Graeff; E. Wierzbicka; M. Lefeld-Sosnowska; A. Kłos

Book ID: 116599287
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 478 KB
Volume: 401
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2005.03.084

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