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Characterization of cadmium telluride thin films fabricated by two-source evaporation technique and Ag doping by ion exchange process

โœ Scribed by A. Ali; N. Abbas Shah; A. Maqsood


Book ID
108271613
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
482 KB
Volume
52
Category
Article
ISSN
0038-1101

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## Abstract Twoโ€source thermal evaporation technique was used to prepare Hg~x~Cd~1โ€x~Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500โ€2700 nm)