Characterization of zinc telluride thin films deposited by two-source technique and post-annealed in nitrogen ambient

✍ Scribed by Akram K.S. Aqili; Zulfiqar Ali; Asghari Maqsood

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 591 KB
• Volume: 317
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2010.12.072