Structural, optical and electrical characterization of HgxCd1-xTe polycrystalline films fabricated by two-source evaporation technique
✍ Scribed by M. Basharat; M. A. Hannan; N. A. Shah; A. Ali; M. Arif; A. Maqsood
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 231 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0232-1300
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✦ Synopsis
Abstract
Two‐source thermal evaporation technique was used to prepare Hg~x~Cd~1‐x~Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500‐2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05 < x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p‐type and exhibited a resistivity, which varied between 10^2^ and 10^‐1^ Ω‐cm. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)