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Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry

✍ Scribed by Kaplan, Bernard ;Novikova, Tatiana ;De Martino, Antonello ;Drévillon, Bernard

Book ID
115351270
Publisher
The Optical Society
Year
2004
Tongue
English
Weight
890 KB
Volume
43
Category
Article
ISSN
1559-128X

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