Characterization of BexCd1–xSe alloys by contactless electroreflectance

✍ Scribed by P. J. Huang; P. Sitarek; Y. S. Huang; O. Maksimov; M. C. Tamargo; F. Firszt; H. Męczyńska

• Book ID: 104557999
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 316 KB
• Volume: 3
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200564661

✦ Synopsis

Abstract

We present characterization of a Bridgman‐grown wurtzite‐type Be~0.075~Cd~0.925~Se mixed crystal and a zinc‐blende Be~0.09~Cd~0.91~Se epilayer grown by MBE on InP substrate using contactless electroreflectance in the temperature range of 15 to 400 K. Various interband transitions, originating from the band edge and spin‐orbit splitting critical points, of the samples have been observed. The parameters that describe the temperature dependence of the fundamental and spin split‐off band gaps are evaluated. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)