Characterization of atom and ion-induced “internal” electron emission by thin film tunnel junctions

✍ Scribed by Detlef Diesing; Domocos Kovacs; Kevin Stella; Christian Heuser

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 609 KB
• Volume: 269
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2010.12.034