Characterization of electron beam evaporated ZnS:Mn thin films by using particle induced x-ray emission analysis

✍ Scribed by Heiji Uchiike; Shuji Hirao; Kunihiko Ohishi; Yoshifumi Fukushima

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 243 KB
• Volume: 33-34
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(88)90366-2