U. Rossow (a), D. E. Aspnes (b), O. Ambacher (c, d), V. Cimalla (a), N. V. Edwards (e), M. Bremser (f, g), R. F. Davis (f), J. A. Schaefer (a), and M. Stutzmann (d)
Characterization of AlxGa1?xN-Compound Layers by Reflectance Difference Spectroscopy
β Scribed by Rossow, U. ;Aspnes, D.E.
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 183 KB
- Volume
- 177
- Category
- Article
- ISSN
- 0031-8965
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