Reflectance Difference Spectroscopy Characterization of AlxGa1—xN-Compound Layers

✍ Scribed by U. Rossow; D.E. Aspnes; O. Ambacher; V. Cimalla; N.V. Edwards; M. Bremser; R.F. Davis; J.A. Schaefer; M. Stutzmann

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 174 KB
• Volume: 216
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199911)216:1<215::aid-pssb215>3.0.co;2-3

✦ Synopsis

U. Rossow (a), D. E. Aspnes (b), O. Ambacher (c, d), V. Cimalla (a), N. V. Edwards (e), M. Bremser (f, g), R. F. Davis (f), J. A. Schaefer (a), and M. Stutzmann (d)