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Characterization of aluminium films deposited by ion-beam-assisted ultrahigh vacuum evaporation

✍ Scribed by V. Dietz; P. Ehrhart; D. Guggi; H.-G. Haubold; W. Jäger; M. Prieler; W. Schilling


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
863 KB
Volume
43-44
Category
Article
ISSN
0257-8972

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