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Characterization of acid diffusion for a negative chemically amplified resist using X-ray proximity lithography

โœ Scribed by Bo K. Choi; J.S. Yang; K.H. Lee; Ohuun Kim


Book ID
114155794
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
260 KB
Volume
41-42
Category
Article
ISSN
0167-9317

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