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Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements

✍ Scribed by De Wolf, P.; Snauwaert, J.; Clarysse, T.; Vandervorst, W.; Hellemans, L.

Book ID: 118236106
Publisher: American Institute of Physics
Year: 1995
Tongue: English
Weight: 381 KB
Volume: 66
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.113636

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