Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy

✍ Scribed by Puntambekar, Kanan P.; Pesavento, Paul V.; Frisbie, C. Daniel

• Book ID: 118118323
• Publisher: American Institute of Physics
• Year: 2003
• Tongue: English
• Weight: 623 KB
• Volume: 83
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1637443