✦ LIBER ✦
A Nano Tester: A New Technique for Nanoscale Electrical Characterization by Point-Contact Current-Imaging Atomic Force Microscopy
✍ Scribed by Otsuka, Yoichi; Naitoh, Yasuhisa; Matsumoto, Takuya; Kawai, Tomoji
- Book ID
- 115455799
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2002
- Tongue
- English
- Weight
- 117 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0021-4922
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