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Characterization of a metastable defect labeled EM3 in hydrogen-implanted n-type silicon using deep-level transient spectroscopy

โœ Scribed by Yutaka Tokuda; Takeshi Seo


Book ID
106398023
Publisher
Springer US
Year
2008
Tongue
English
Weight
237 KB
Volume
19
Category
Article
ISSN
0957-4522

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