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Characterization methods for ultrafiltration membranes

✍ Scribed by G. Trägårdh

Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
511 KB
Volume
53
Category
Article
ISSN
0011-9164

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Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) were used to investigate the surface of ultraÐltration membranes with pore sizes of ¿10 nm. It is widely accepted that conventional AFM with TiO 2 or Si tips is not able to resolve pores in supported ceramic membranes with a dia