Characteristics of Deep Electron Levels in Oxygen-Implanted and (Oxygen + Silicon) Co-Implanted n-GaAs

✍ Scribed by Quan, Dang Tran ;Le Bloa, A. ;Guennouni, Z. ;Favennec, P. N.

• Publisher: John Wiley and Sons
• Year: 1992
• Tongue: English
• Weight: 554 KB
• Volume: 132
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211320115