Characteristic Instabilities in HfAlO Metal–Insulator–Metal Capacitors Under Constant-Voltage Stress

✍ Scribed by Takeda, K.; Yamada, R.; Imai, T.; Fujiwara, T.; Hashimoto, T.; Ando, T.

• Book ID: 114619409
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 571 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.921978