An Innovative Understanding of Metal–Insulator–Metal (MIM)-Capacitor Degradation Under Constant-Current Stress

✍ Scribed by Chi-Chao Hung; Oates, A.S.; Horng-Chih Lin; Yu-En Chang, P.; Jia-Lian Wang; Cheng-Chung Huang; You-Wen Yau

• Book ID: 118207157
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 441 KB
• Volume: 7
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/tdmr.2007.907406