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Characterising gate dielectrics in high mobility devices using novel nanoscale techniques

✍ Scribed by R. Kapoor; E. Escobedo-Cousin; S.H. Olsen; S.J. Bull

Book ID: 104056454
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 851 KB
Volume: 50
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.07.124

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