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Characterisation of MgB2 thin films of varying Tc by Raman spectroscopy

✍ Scribed by K.A. Yates; G. Burnell; Z. Lockman; A. Kursumovic; J.L. MacManus Driscoll; M.G. Blamire

Book ID
108191174
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
171 KB
Volume
67
Category
Article
ISSN
0022-3697

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✍ Niilisk, Ahti ;Moppel, Mart ;PΓ€rs, Martti ;Sildos, Ilmo ;Jantson, Taavi ;Avarmaa πŸ“‚ Article πŸ“… 2006 πŸ› Walter de Gruyter GmbH 🌐 English βš– 269 KB

The Raman spectroscopy method was used for structural characterization of TiO 2 thin films prepared by atomic layer deposition (ALD) and pulsed laser deposition (PLD) on fused silica and single-crystal silicon and sapphire substrates. Using ALD, anatase thin films were grown on silica and silicon su