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Characterisation of HfO2 deposited by photo-induced chemical vapour deposition

✍ Scribed by Q. Fang; J.-Y. Zhang; Z.M. Wang; J.X. Wu; B.J. O'Sullivan; P.K. Hurley; T.L. Leedham; H. Davies; M.A. Audier; C. Jimenez; J.-P. Senateur; Ian W. Boyd


Book ID
108388556
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
249 KB
Volume
427
Category
Article
ISSN
0040-6090

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High-k dielectrics by UV photo-assisted
✍ Q. Fang; J.Y. Zhang; Z.M. Wang; G. He; J. Yu; Ian W. Boyd πŸ“‚ Article πŸ“… 2003 πŸ› Elsevier Science 🌐 English βš– 426 KB

An overview of our recent work on thin films of metal oxides deposited on silicon by a novel excimer lamp-assisted ultraviolet injection liquid source CVD (UVILS-CVD) process for advanced high-k gate dielectrics applications will be presented. Recent results on TiO , Ta O , ZrO , HfO , and TiO -dope