✦ LIBER ✦

Channeling spectrometry in HTSC thin film analysis

✍ Scribed by J. Remind; J. Geerk; G. Linker; O. Meyer; R.L. Wang; Th. Wolf

Book ID: 113282923
Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 379 KB
Volume: 64
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(92)95460-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Microwave mixing processes in HTSC thin

Microwave mixing processes in HTSC thin films

✍ K.Y. Constantinian; L.E. Amatuni; A.A. Hakhumian; R.B. Hayrapetian; R.M. Martiro 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Epitaxial growth analysis of YBaCuO thin

Epitaxial growth analysis of YBaCuO thin films by ion backscattering and channeling spectrometry

✍ O. Meyer; J. Geerk; Q. Li; G. Linker; X.X. Xi 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 564 KB

Direct observation of cation disordering

Direct observation of cation disordering in HTSC thin films

✍ A.P. Brodyanskii; I.M. Dmitrenko; A.I. Erenburg; A.V. Fomin; Yu.A. Klimovsky 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 133 KB

Amplitudes of random telegraph noise in

Amplitudes of random telegraph noise in HTSC thin films

✍ M. Bonaldi; G. Jung; A. Vecchione; S. Vitale 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 148 KB

Inorganic mass spectrometry for surface

Inorganic mass spectrometry for surface and thin film analysis

✍ Hans Oechsner 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 722 KB

After a discussion of several fundamental aspects connected with the mass spectrometry of sputter-removed particles for surface and thin-film analysis and a comparison between secondary neutral mass spectrometry (SNMS) and glow discharge mass spectrometry, novel instrumental developments in SNMS for

Radiative defects structure in HTSC thin

Radiative defects structure in HTSC thin films: polarized XAS study

✍ A.P. Menushenkov; A.Yu. Ignatov; V.A. Chernov; S.G. Nikitenko 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 397 KB