✦ LIBER ✦

Change in stoichiometry of thin films of palladium chloride during ion beam analysis

✍ Scribed by J.L. Whitton; G. Sørensen; J.S. Williams

Publisher: Elsevier Science
Year: 1978
Weight: 311 KB
Volume: 149
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(78)90962-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ion beam analysis of thin films

✍ CJ Sofield; JA Cookson 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 157 KB

Ion beam analysis of PECVD silicon oxide

Ion beam analysis of PECVD silicon oxide thin films

✍ F. Fernandez-Lima; J.A. Rodriguez; E. Pedrero; H.D. Fonseca Filho; A. Llovera; M 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 202 KB

A study of ion beam analysis techniques of plasma enhanced chemical vapor deposited (PECVD) silicon oxide thin films (1 lm thick) obtained from silane (SiH 4 ) and nitrous oxide (N 2 O) is reported. The film, elemental composition and surface morphology were determined as function of the reactant ga

Applications of microfocussed ion beams

Applications of microfocussed ion beams in surface and thin film analysis

✍ RE Thurstans; J Wolstenholme 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 703 KB

Lifetimes of thin films in ion beam expe

Lifetimes of thin films in ion beam experiments

✍ D. Ramsay 📂 Article 📅 1979 🏛 Elsevier Science ⚖ 274 KB

Atmosphere influence on in-situ ion beam

Atmosphere influence on in-situ ion beam analysis of thin film growth

✍ Yuping Lin; Alan R. Krauss; Robert P.H. Chang; Orlando H. Auciello; Dieter M. Gr 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 581 KB

Application of ion beam techniques for a

Application of ion beam techniques for amorphization and analysis of thin films

✍ G Linker 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 849 KB