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Application of ion beam techniques for amorphization and analysis of thin films

โœ Scribed by G Linker


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
849 KB
Volume
36
Category
Article
ISSN
0042-207X

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Ion beam analysis of thin films
โœ CJ Sofield; JA Cookson ๐Ÿ“‚ Article ๐Ÿ“… 1985 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 157 KB