Application of ion beam techniques for amorphization and analysis of thin films : G. Linker. Vacuum36(7–9), 493 (1986)

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 135 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90160-0