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Chaneling effect measurements of the recrystallization of amorphous Si layers on crystal Si

✍ Scribed by L. Csepregi; J.W. Mayer; T.W. Sigmon

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 180 KB
Volume: 54
Category: Article
ISSN: 0375-9601
DOI: 10.1016/0375-9601(75)90847-6

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