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CdTe-GaAs(100) interface: MBE growth, rheed and XPS characterization

✍ Scribed by J.P. Faurie; C. Hsu; S. Sivananthan; X. Chu


Publisher
Elsevier Science
Year
1986
Weight
48 KB
Volume
168
Category
Article
ISSN
0167-2584

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## Abstract In order to find the origin of crystalline defects occurring in the preparation of InAs/GaAs quantum dots (QDs), their appearance was tracked through three different sample types designed as Schottky diodes. Specimens with a GaAs cap layer on a GaAs buffer layer as well as with an InAs