The application of RHEED intensity effects to interrupted growth and interface formation during MBE growth of GaAs/(Al, Ga)As structures

✍ Scribed by B. A. Joyce; J. Zhang; J. H. Neave; P. J. Dobson

• Publisher: Springer
• Year: 1988
• Tongue: English
• Weight: 481 KB
• Volume: 45
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/bf00615013