Cast epoxy resin shields against X-rays
โ Scribed by Permali Gloucester Ltd
- Publisher
- Elsevier Science
- Year
- 1988
- Weight
- 143 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0308-9126
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๐ SIMILAR VOLUMES
Residual stress in particulate epoxy resin was investigated by X-ray diffraction. Microdeformation of incorporated A1 and a-Si02 crystal, which was induced by the residual stress, could be detected as a shift of X-ray diffraction peak. The residual stress at the interface between the adherend and th
Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th